Integrated Photonics Lab Research Facilities

Integrated Photonics lab

Our lab is well-equipped with photonic and optoelectronic device characterization probe stations and measurement equipment.

View List of Integrated Photonics Lab Equipment

Model	Instrument	Functionality	Data Sheet	User Guide
Keysight 86122C	Multi-wavelength Meter	• Measure the wavelength and optical power of lasers • Wavelength range: 1270 –1650 nm • Maximum power measurements: +10 dBm (10 mW) • Total optical power • Laser line separation (FSR) • Laser drift (wavelength and power) • Optical signal-to-noise ratios (SNR) • Max safe input optical power: +18 dBm (~63 mW)	Link	Link
Keysight N7776C	Tunable Laser (O-band)	• Tunable laser source • Wavelength range: 1240 – 1380 nm • Optical power < 25 mW • Resolution: 0.1 pm • Linewidth < 10 kHz • SMSR ≥ 60 dB • RIN < –150 dB/Hz	Link	Link
Keysight N7776C	Tunable Laser (C-band)	• Tunable laser source • Wavelength range: 1490 – 1640 nm • Optical power < 25 mW • Resolution: 0.1 pm • Linewidth < 10 kHz • SMSR ≥ 60 dB • RIN < –150 dB/Hz	Link	Link
Keysight N7742C	High-Power Meter	• Two-channel optical power measurement • InGaAs detector • Wavelength range: 800 – 1650 nm • Power range: –80 dBm to +10 dBm • Analog electrical output: 0 V to 2 V • Frequency response < 250 kHz • Max safe input optical power: +16 dBm (~39 mW)	Link	Link
Keysight N7761A	Variable Optical Attenuator (VOA)	• Insertion loss ≤ 2.2 dB • FC/APC single-mode fiber input • Wavelength range: 1260 – 1640 nm • Attenuation range: 0 – 40 dB • InGaAs detector • Max safe input optical power: +23 dBm (~200 mW)	Link	Link
Keysight N4373E	Lightwave Component Analyzer (LCA)	• To be used with PNA Network Analyzer (Keysight N5227B-400) • Measures the frequency response and 3dB bandwidth (S₂₁) • Measure the 3dB bandwidth (S₂₁) • Measure the transmission bandwidth (S₂₁) • Measure the RF reflection (S₁₁or S₂₂) • Measure the insertion Loss (S₂₁) • Measure all electrical S-parameters • Straight FC/PC single-mode fiber input • Target devices: Laser diodes (for direct modulation) Modulators (MZM, EOM, EAM) Photodiodes (PIN, APD) Passive devices and waveguides • Modulation frequency range: 10 MHz – 65 GHz • −1 dBm electrical output power • Uses internal laser source • Wavelength range: 1260 – 1620 nm • Power measurement range (Optical input 1): −25 dBm to +5 dBm • Power measurement range (Optical input 2): −15 dBm to +15 dBm • Max safe input optical power (Optical input 1): +7 dBm (~5 mW) • Max safe input optical power (Optical input 2): +17 dBm (~50 mW) • Max safe input electrical power at ports A and B: +15 dBm, 7 V DC	Link	Link
Keysight N1092C	Digital Communication Analyzer (DCA)	Measure and analyze digital communication waveforms based on amplitude modulation schemes (OOK, PAM4, OFDM) Obtain the eye diagram Wavelength range: 830 – 1600 nm Optical Channel 3dB Bandwidth: 28 GHz Optical channel power sensitivity (min. power for good eye diagram): -12 dBm (~60 µW) Maximum measurable input power: 4 mW	Link	Link
Keysight M8040A	Bit-error-rate Tester (BERT) with built-in pattern generator	Has three modules: Analyzer Module M8046A (Error Detector) Pattern generator module M8045A (AWG) Interference source Real-time analysis of NRZ digital communication signals Generates NRZ signals Generates FEC encoded patterns Two pattern generator channels Symbol rate (generation): 2 to 32 Gbaud (symbol/s) Sequence length: 2ⁿ–1, n= 7, 10, 11, 15, 23, 23p, 31, 33, 35, 39, 45, 49, 51	Link	Link

KAUST Core Labs

KAUST offers access to cutting-edge technology for material characterization and comprehensive facilities for micro and nanofabrication. Those facilities are supported and maintained by excellent and experienced scientists, engineers, and technicians.

The Nanofabrication Core Lab (NCL)

The Nanofabrication Core Lab consists of world-class lab space, including 2,000 square meters of cleanroom facilities, a microfluidics lab, and a thin film deposition lab. Our Cleanroom service areas include metrology and bonding; etching; deposition and thermal processing and lithography and mask making. In the lab, users fabricate and characterize a wide variety of structures and devices at the nano- and micro-scale for many applications, such as laser diodes, bio-sensors, solar cells, super-capacitors, transistors, flexible electronics, spintronic devices, and others. Our microfluidics facility offers various fabrication techniques, measuring, sensing, and platforms for experiments specific to the field's latest developments. The Thin Films Lab has various physical and chemical vapor deposition and characterization facilities to support fundamental and applied research. We offer film thicknesses ranging from a few monolayers to hundreds of nanometers.

Visit the Nanofabrication Core Lab webpage here for more: https://corelabs.kaust.edu.sa/labs/detail/nanofabrication-core-lab

The Imaging & Characterization Core Lab (IAC)

The Imaging & Characterization Core Lab delivers a broad array of capabilities in imaging, structure, and spectroscopy characterization include: electron microscopy; nuclear magnetic resonance spectroscopy; physical characterization; optical microscopy; and surface science.

Visit the Imaging & Characterization Core Lab here for more: https://corelabs.kaust.edu.sa/labs/detail/imaging-and-characterization-core-lab

Collaborations with semiconductor material growers

We have close collaborations with semiconductor material growers working with MBE and MOCVD in KAUST, as well as international collaborators in UCSB and HKUST.

Integrated Photonics Lab Research Facilities